Integrated circuit testing for quality assurance in manufacturing.
Over the years of its development, the integrated circuit technology has brought great progress to the design of high performance systems, many challenges in the manufacturing process had to be solved to achieve this. One of the step in the process, namely testing, is posing the most significant chall
due to decreasing silicon cost and increasing complexity of integrated circuits, testing constitutes a very sizable portion of the IC manufacturing cost. This trend is further accentuated by the emergence of mixed signal, including radio frequency circuits, coupled with the competitive price pressures of the high volume consumer market, frequently, the cost of testing a chip with CODEC, enge to contemporary and future integrated circuit (IC) manufacturing, this is a continuing trend, because
Due to unavoidable statistical flaws in the materials and masks used to fabricate IC's, it is impossible to realize 100% yield on any particular IC, where yield refers to the ratio of good IC's to the total number of IC's fabricated . A good IC is one that satisfies all of its performance specifications under all specified conditions. The probability of a bad ic increases in proportion to its size and complexity, it is also increases by process sensitivities that occur in digital and analog IC's that rely on the control or matching of IC components or parameters to achieve their specified functionality, The details that govern IC yield and the associated economics that drive IC manufacturing are very interesting, but beyond the scope of this paper, the interested reader is referred to the literature, in any event, testing is an indispensable part of the IC manufacturing process.
IC test basic role is to examine the significance and whether the product have a problem. A good test process can be blocked for all substandard products before they reach the hands of users.
(2) design is incorrect;ble reasons for the failure of the test: (1) processing problems;
(3) product specifications in question.